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Precise identification of graphene layers at the air-prism interface via a pseudo-Brewster angle

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成果类型:
期刊论文
作者:
Mi, Chengquan;Chen, Shizhen;Wu, Weijie;Zhang, Wenshuai;Zhou, Xinxing;...
通讯作者:
Luo, Hailu
作者机构:
[Wu, Weijie; Shu, Weixing; Wen, Shuangchun; Zhang, Wenshuai; Luo, Hailu; Mi, Chengquan; Chen, Shizhen] Hunan Univ, Lab Spin Photon, Sch Phys & Elect, Changsha 410082, Hunan, Peoples R China.
[Zhou, Xinxing] Hunan Normal Univ, Synerget Innovat Ctr Quantum Effects & Applicat, Coll Phys & Informat Sci, Changsha 410081, Hunan, Peoples R China.
[Ling, Xiaohui] Hengyang Normal Univ, Coll Phys & Elect Engn, Hengyang 421002, Peoples R China.
通讯机构:
[Luo, Hailu] H
Hunan Univ, Lab Spin Photon, Sch Phys & Elect, Changsha 410082, Hunan, Peoples R China.
语种:
英文
关键词:
Atomic force microscopy;Fresnel reflection;Graphene;Optical constants;Optical properties;Reflection coefficient
期刊:
Optics Letters
ISSN:
0146-9592
年:
2017
卷:
42
期:
20
页码:
4135-4138
基金类别:
National Natural Science Foundation of China (NSFC)National Natural Science Foundation of China (NSFC) [11474089]
机构署名:
本校为其他机构
院系归属:
物理与电子工程学院
摘要:
We propose a simple method for the precise identification of graphene layers at the air-prism interface via a pseudo-Brewster angle, where the horizontally polarized reflection is close to zero. We find that the pseudo-Brewster angle is sensitive to the variation of graphene layers where the pseudo-Brewster angle is approximately linearly increased about 0.5 deg as the layer numbers increased. Furthermore, the sensitivity of the pseudo-Brewster angle can be greatly enhanced and reaches 0.04 deg by eliminating the influence of the cross-polarization effect. Our scheme can provide a simple and e...

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