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The study of charge injection mechanism of C60/CuPc organic heterojunction connector layer

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成果类型:
期刊论文
作者:
Lu, Feiping;Wang, Jinjiang;Deng, Yanhong*
通讯作者:
Deng, Yanhong
作者机构:
[Lu, Feiping] Tianshui Normal Univ, Dept Phys, Tianshui 741000, Peoples R China.
[Deng, Yanhong; Wang, Jinjiang] Hengyang Normal Univ, Coll Phys & Elect Engn, Hengyang 421002, Peoples R China.
通讯机构:
[Deng, Yanhong] H
Hengyang Normal Univ, Coll Phys & Elect Engn, Hengyang 421002, Peoples R China.
语种:
英文
期刊:
AIP Advances
ISSN:
2158-3226
年:
2020
卷:
10
期:
7
页码:
075316
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [61665010, 61540076]; Natural Science Foundation of Gansu Province [18JR3RE242]; general topic of 2019 in the 13th Five-Year Plan of Education Science of Gansu Province [GS[2019]GHB2112]; Hunan Provincial Natural Science Foundation of ChinaNatural Science Foundation of Hunan Province [2018JJ3010]; Science and Technology Plan Project in Hengyang City; QinLan" Talent Engineering Fund by Tianshui Normal University; Excellent Talents Program of HYNU
机构署名:
本校为通讯机构
院系归属:
物理与电子工程学院
摘要:
The charge injection mechanism of a connector layer is one of the critical issues influencing the performance of tandem organic light-emitting diodes (OLEDs). In this paper, to explore the charge injection mechanism of an organic heterojunction connector (OHJC) layer, we studied the device current density (J) characteristics generated by the C60/CuPc OHJC layer under different applied voltages (V). By analyzing the log(J)-V1/2 and ln(J/E)-1/E2 characteristics of devices, we found that the charge injection mechanism of the C60/CuPc OHJC layer is...

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