A Scheduling Test Partitioning Method under Thermally Constrained for 3D stacked Integrated Cir- cuits was presented. The method considering the partition conditions and does not violate temperature constraints of each test are divided according to the original test temperature, allowing more tests parallel execution, to achieve the maximum overlap between tests. The experimental results on the ITC' 02 benchmark circuits show that, in envi- ronments where temperature has a significant impact, the partitioning method can improvement the schedul...