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Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains

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成果类型:
期刊论文
作者:
Tan, Y.;Yuan, H.;Kearfott, K. J.
通讯作者:
Tan, Y;Yuan, H
作者机构:
[Yuan, H.; Tan, Y.] Hengyang Normal Univ, Coll Phys & Elect Engn, Hengyang 421008, Hunan, Peoples R China.
[Kearfott, K. J.] Univ Michigan, Dept Nucl Engn & Radiol Sci, Ann Arbor, MI 48109 USA.
通讯机构:
[Tan, Y; Yuan, H] H
Hengyang Normal Univ, Coll Phys & Elect Engn, Hengyang 421008, Hunan, Peoples R China.
语种:
英文
关键词:
Solid state detectors;Particle tracking detectors (Solid-state detectors)
期刊:
Journal of Instrumentation
ISSN:
1748-0221
年:
2018
卷:
13
期:
4
页码:
T04005
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [11375058]; Science and Technology Development Plan Project in Hengyang City [2017KJ159]; Cooperative Innovation Center for Digitalization of Cultural Heritage in Ancient Villages and Towns; Construct Program of the Key Discipline in Hunan province; Consortium for Verification Technology under the Department of Energy National Nuclear Security Administration [DE-NA0002534]
机构署名:
本校为第一且通讯机构
院系归属:
物理与电子工程学院
摘要:
CR-39 detectors are widely used to measure environmental levels of Rn-222, Rn-220 and their progeny. Prior research reported the CR-39 detection efficiency for alpha particles from Rn-222, Rn-220 and their progeny under a variety of etching conditions. This paper provides an explanation for interesting observations included in that work, namely that the critical incidence angle decreases with the increasing particle energy and the detection efficiency for 8.78 MeV alpha particles is zero. This paper explains these phenomena from a consideration of the interaction of alpha particles with the CR...

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